Day-to-Day Responsibilities
Collect and analyse wafer test, inspection and metrology data to track yield by lot, tool and process step.
Use wafer maps and failure patterns to spot where and when defects appear.
Run root-cause investigations with process, equipment and integration teams.
Set up and monitor statistical process control charts and yield alerts.
Plan and review controlled trials, such as design of experiments, to test process changes.
Track the effect of each change on yield and report results to fab management.
Document findings and keep yield-learning records for future batches.
